A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

Duke engineers show how a common device architecture used to test 2D transistors overstates their performance prospects in real-world devices.

Cornell researchers have used advanced electron microscopy to identify "mouse bite" defects in 3D transistors for the first time ...

A bioelectronic engineer, Klas Tybrandt of Linkoping University in Sweden, has built the first "ion transistor" computer chip, which uses chemical ions and biological molecules as charge carriers ...